April 8, 2010 13:00 - 17:00
Empa, Dübendorf, AKADEMIE
see box top right
Electron microscopes hold the keys to the micro- and nanouniverse of modern material system. They provide us with valuable insight about the composition of materials down to the atomic scale.
This topical day provides an overview of modern electron microscopy techniques, including focused-ion beam applications. Selected topics are elucidated by internal and external experts.