Online Archive

10. - 11. February 2016

Empa, Thun, Feuerwehrstrasse 39

Industry and Science

Speakers

see program

Industry and Science

Information

see right

Content

TOPIC

Scanning electron microscopes (SEMs) are the Swiss knifes of materials analysis instruments. Modern SEMs in particular if combined with focused ion beams (Dual beam FIBs) provide a larger number of multimodal imaging and different analytical methods.

 

Cancellation
For cancellations after January 27, 2016, 50% of the fee will be charged. After February 3, 2016, or in case of non appearance we will charge the full fee. A substitute will be accepted anytime.