10. - 11. February 2016
Empa, Thun, Feuerwehrstrasse 39
Scanning electron microscopes (SEMs) are the Swiss knifes of materials analysis instruments. Modern SEMs in particular if combined with focused ion beams (Dual beam FIBs) provide a larger number of multimodal imaging and different analytical methods.
For cancellations after January 27, 2016, 50% of the fee will be charged. After February 3, 2016, or in case of non appearance we will charge the full fee. A substitute will be accepted anytime.