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Workshop

29. June, 9:00 - June 30, 2016 17:00

Empa, Dübendorf, AKADEMIE

Industry and Science

Industry and Science

Information

see  top right

Content

EFDS and Empa are co-organizing this Workshop, that will provide you with an overview of the most important techniques for surface and thin film characterization:

  • Ion beam analysis (RBS, ERDA, NRA)
  • XPS (ESCA)
  • ToF-SIMS
  • Electron microscopy (STEM, SEM)
  • Scanning probe microscopies (AFM, STM, MFM)
  • XRD and X-ray tomography
  • Surface mechanical properties (hardness, modulus)

For more details see program.