29. November 1. December 2021
Empa, Feuerwerkerstrasse 39, Thun
Dual SEM/FIB device are becoming increasingly common and popular as they allow sophisticated multi-modal imaging and analysis/characterisation of nano- and micro-structured materials. The aim of the course is to present the extended analytical possibilities with such device, by combining several excitation probes and signal detectors on a common instrument chamber. The instrumentation suite we present combines the excitation techniques of an electron microscope, a focused ion beam microscope, a collimated X-ray source and a laser beam together with various detectors to allow imaging and measurement techniques such as EDS, WDS, TOF-SIMS, EBSD and XRF.
The following subjects will be presented during the course:
For more information please see the flyer.
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